Waveguide Spectroscopy of Thin Films

Alexander Vasil'evich Khomchenko

Anno: 2005
Rilegatura: Hardback
Pagine: 236 p.
Testo in English
Dimensioni: 229 x 152 mm
Peso: 500 gr.
  • EAN: 9780120885152
pagabile con 18App pagabile con Carta del Docente

Articolo acquistabile con 18App e Carta del Docente

€ 108,57

€ 115,50

Risparmi € 6,93 (6%)

Venduto e spedito da IBS

109 punti Premium

Disponibile in 10 gg

Quantità:
Descrizione

In Waveguide Spectroscopy of Thin Films new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures. Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered. This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties.