Advanced Parallel Processing Technologies: 7th International Symposium, APPT 2007 Guangzhou, China, November 22-23, 2007 Proceedings

Ming Xu (Curatore)

Yinwei Zhan (Curatore)

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2007

We are currently witnessing a proliferation in parallel and distributed processing technologies and applications. However, more new technologies have ushered in unprecented challenges to the research community across the range of high-performance computing, multi-core microprocessor architecture, networks and pervasive computing, as well as new paradigm computing issues. APPT 2007 was sponsored by the China Computer Federation, in cooperation with TCPP of the Institute for Electrical and Electronics Engineers (IEEE). The highly positive responses to the previous APPT workshops encouraged us to continue this international event. This year, APPT was upgraded to the International Symposium on Advanced Parallel Processing Technologies. However, it kept its traditional flavor by sharing of the underlying theories and applications, and the establishment of new and long-term collaborative channels. And it will continue to provide a forum for researchers, professionals, and industrial practitioners from around the world to report on new advances in high-performance architecture and software, as well as to identify issues and directions for research and development in the new era of evolving technologies. The success of APPT 2007 was a result of the hard work and planning of a large group of renowned researchers from around the world, who served on the Technical Program Committee and the Organizing Committee. Their invaluable efforts in developing this technical program are most gratefully acknowledged. In particular, we would like to thank the Program Co-chairs, Xin Chen, Xuejun Yang, and Albert Y. Zomaya.

• Curatore: Ming Xu, Yinwei Zhan
• Editore: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Collana: Lecture Notes in Computer Science
• Anno: 2007
• Rilegatura: Paperback / softback
• Pagine: 772 p.
• Dimensioni: 235 x 155 mm
• EAN: 9783540768364

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