Advances in X-Ray Analysis: Volume 3 Proceedings of the Eighth Annual Conference on Applications of X-Ray Analysis Held August 12–14, 1959

di William M. Mueller (Autore)

Springer-Verlag New York Inc., 2012

It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com­ munity, a versatility limited only by the imagination and inge­ nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt­ edly be influenced by today's extremely low- and very high-tem­ perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame­ nable to pathological and physiological diagnosis. The experi­ mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac­ complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re­ searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.

• Autore: William M. Mueller
• Editore: Springer-Verlag New York Inc.
• Anno: 2012
• Rilegatura: Paperback / softback
• Pagine: 376 p.
• Dimensioni: 229 x 152 mm
• EAN: 9781468474039

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