Design for AT-Speed Test, Diagnosis and Measurement

Benoit Nadeau-Dostie (Curatore)

Springer-Verlag New York Inc., 2013

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

• Curatore: Benoit Nadeau-Dostie
• Editore: Springer-Verlag New York Inc.
• Collana: Frontiers in Electronic Testing
• Anno: 2013
• Rilegatura: Paperback / softback
• Pagine: 239 p.
• Dimensioni: 254 x 178 mm
• EAN: 9781475782912

Testo in English