Ellipsometry at the Nanoscale

Maria Losurdo (Curatore)

Kurt Hingerl (Curatore)

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2016

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.

• Curatore: Maria Losurdo, Kurt Hingerl
• Editore: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Anno: 2016
• Rilegatura: Paperback / softback
• Pagine: 730 p.
• Dimensioni: 235 x 155 mm
• EAN: 9783662519714

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