Progress in Nanoscale Characterization and Manipulation

Rongming Wang (Curatore)

Chen Wang (Curatore)

Springer Verlag, Singapore, 2018

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

• Curatore: Rongming Wang, Chen Wang
• Editore: Springer Verlag, Singapore
• Collana: Springer Tracts in Modern Physics
• Anno: 2018
• Rilegatura: Hardback
• Pagine: 508 p.
• Dimensioni: 235 x 155 mm
• EAN: 9789811304538

Testo in English