Reliable Knowledge Discovery

Honghua Dai (Curatore)

James N. K. Liu (Curatore)

Springer-Verlag New York Inc., 2012

Reliable Knowledge Discovery focuses on theory, methods, and techniques for RKDD, a new sub-field of KDD. It studies the theory and methods to assure the reliability and trustworthiness of discovered knowledge and to maintain the stability and consistency of knowledge discovery processes. RKDD has a broad spectrum of applications, especially in critical domains like medicine, finance, and military. Reliable Knowledge Discovery also presents methods and techniques for designing robust knowledge-discovery processes. Approaches to assessing the reliability of the discovered knowledge are introduced. Particular attention is paid to methods for reliable feature selection, reliable graph discovery, reliable classification, and stream mining. Estimating the data trustworthiness is covered in this volume as well. Case studies are provided in many chapters. Reliable Knowledge Discovery is designed for researchers and advanced-level students focused on computer science and electrical engineering as a secondary text or reference. Professionals working in this related field and KDD application developers will also find this book useful.

• Curatore: Honghua Dai, James N. K. Liu
• Editore: Springer-Verlag New York Inc.
• Anno: 2012
• Rilegatura: Hardback
• Pagine: 310 p.
• Dimensioni: 235 x 155 mm
• EAN: 9781461419020

Testo in English