Scan Statistics

Birkhäuser, 2009

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. The chapters are written by leading experts in the field of scan statistics. Key features include many current results and new directions for future research; challenging theoretical methodological research problems; presentation accessible to both statisticians and scientists from other disciplines where scan statistics are employed; emphasis on real-world applications to areas such as bioinformatics and biosurveillance; and extensive references to research articles, books, and relevant computer software. Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.

• Curatore: Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein
• Anno edizione: 2009
• Editore: Birkhäuser
• Formato: EPUB2 con Adobe DRM
• Lingua: Inglese
• Compatibilità: Tutti i dispositivi (eccetto Kindle)
• Layout: Reflowable
• EAN: 9780817647490