Speckle Metrology

di Sirohi (Autore)

Taylor & Francis Inc, 1993

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.

• Autore: Sirohi
• Editore: Taylor & Francis Inc
• Collana: Optical Science and Engineering
• Anno: 1993
• Rilegatura: Hardback
• Pagine: 572 p.
• Dimensioni: 229 x 152 mm
• Peso: 861 gr.
• EAN: 9780824789329

Testo in English