Applied Logistic Regression

di Stanley Lemeshow (Autore)

Rodney X. Sturdivant (Autore)

David W. Hosmer (Autore)

John Wiley & Sons Inc, 2013

A new edition of the definitive guide to logistic regression modeling for health science and other applications This thoroughly expanded Third Edition provides an easily accessible introduction to the logistic regression (LR) model and highlights the power of this model by examining the relationship between a dichotomous outcome and a set of covariables. Applied Logistic Regression, Third Edition emphasizes applications in the health sciences and handpicks topics that best suit the use of modern statistical software. The book provides readers with state-of-the-art techniques for building, interpreting, and assessing the performance of LR models. New and updated features include: A chapter on the analysis of correlated outcome data A wealth of additional material for topics ranging from Bayesian methods to assessing model fit Rich data sets from real-world studies that demonstrate each method under discussion Detailed examples and interpretation of the presented results as well as exercises throughout Applied Logistic Regression, Third Edition is a must-have guide for professionals and researchers who need to model nominal or ordinal scaled outcome variables in public health, medicine, and the social sciences as well as a wide range of other fields and disciplines.

• Autore: Stanley Lemeshow, Rodney X. Sturdivant, David W. Hosmer
• Editore: John Wiley & Sons Inc
• Collana: Wiley Series in Probability and Statistics
• Anno: 2013
• Rilegatura: Hardback
• Pagine: 528 p.
• Dimensioni: 236 x 159 mm
• Peso: 748 gr.
• EAN: 9780470582473

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