Debug Automation from Pre-Silicon to Post-Silicon

di Mehdi Dehbashi (Autore)

Görschwin Fey (Autore)

Springer International Publishing AG, 2014

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

• Autore: Mehdi Dehbashi, Görschwin Fey
• Editore: Springer International Publishing AG
• Anno: 2014
• Rilegatura: Hardback
• Pagine: 171 p.
• Dimensioni: 235 x 155 mm
• EAN: 9783319093086

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