X-Ray Spectroscopy: An Introduction

di Bipin K. Agarwal (Autore)

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 1991

An attempt has been made in this edition of the book to retain the appeal of the first edition even after the addition of new material and the deletion of other matter which no longer appears essential. Major revisions have been made in almost all the chapters to include new developments. The material on EXAFS has been updated and put in a separate chapter. The chapter on experimental methods has been considerably expanded to include energy dispersive techniques. New topics like heavy-ion bremsstrah- lung, X-ray lasers, resonant emission, appearance potential spectroscopy, and EXAFS of high-Tc superconducting materials have been added. It is hoped that readers will find the new edition more useful and attractive. I am grateful to Professor R. H; Pratt, University of Pittsburgh, for reading the revisedversion of the first chapter, to Dr. H. Lotsch, of Springer-Verlag, for encouraging meto revisethe book,and to Prashant and Seemafor helping mein preparing the manuscript. Allahabad, B. K. Agarwal July 1989 Preface to the First Edition Rontgen's discovery of X-rays in 1895launched a subject which became central to the development of modem physics. The verification of many of the predictions of quantum theory by X-ray spectroscopy in the early part of the twentieth century stimulated great interest in this area, which has subsequently influenced fieldsas diverseas chemicalphysics, nuclear physics,and the study of the electronic properties of solids,and led to the development of techniques such as Auger, Raman, and X-ray photoelectron spectroscopy.

• Autore: Bipin K. Agarwal
• Editore: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Collana: Springer Series in Optical Sciences
• Anno: 1991
• Rilegatura: Paperback / softback
• Pagine: 421 p.
• Dimensioni: 235 x 155 mm
• EAN: 9783540507192

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